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Accurate method of measuring grain misorientations and analysing grain boundary planes in TEM
Author(s) -
Voice W. E.,
Faulkner R. G.
Publication year - 1984
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1984.tb02531.x
Subject(s) - misorientation , nimonic , grain boundary , materials science , superalloy , metallurgy , grain boundary strengthening , boundary (topology) , mathematics , microstructure , mathematical analysis
SUMMARY A description of a TEM method for accurately determining the misorientation across grain boundaries, and identification of the grain boundary plane is given. The method is equally applicable to thin or thick foils and possesses the accuracy of Kikuchi line analysis. A computer program is available to process the TEM data to yield directly the grain boundary misorientation parameters. Examples of the application of the method to grain boundary structure determination in a nickel base superalloy, Nimonic 80A, are quoted.