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Review of the principal contrast effects observed at interphase boundaries using transmission electron microscopy
Author(s) -
Pond R. C.
Publication year - 1984
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1984.tb02530.x
Subject(s) - interphase , diffraction , transmission electron microscopy , electron diffraction , contrast (vision) , materials science , selected area diffraction , electron , crystallography , electron microscope , image contrast , lattice (music) , optics , condensed matter physics , molecular physics , physics , chemistry , nanotechnology , biology , quantum mechanics , genetics , acoustics
SUMMARY This review is concerned with the interpretation of contrast features observed at interphase interfaces using conventional transmission electron microscopy. The principal features which arise are interfacial dislocations and steps, four types of fringes, namely thickness, Δ w , displacement and moiré fringes, and lattice images. The contrast mechanisms leading to these features are discussed in the framework of the dynamical theory of electron diffraction. In particular, the influence on image contrast of the cyrstal composition and structure, the interfacial configuration and the crystallographic relationship of the two phases in the specimen is considered. In general, electron diffraction in bi‐crystalline specimens is complicated, and reliable interpretation can only be carried out when the diffraction conditions have been carefully established. The diffraction conditions most widely used are discussed, and their relative merits compared.