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Improved anticontaminator for cryo‐electron microscopy with a Philips EM 400
Author(s) -
Homo JeanClaude,
Booy Frank,
Labouesse Patrick,
Lepault Jean,
Dubochet Jacques
Publication year - 1984
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1984.tb00543.x
Subject(s) - electron microscope , liquid nitrogen , materials science , microscopy , scanning electron microscope , cryo electron microscopy , microscope , optical microscope , transmission electron microscopy , humidity , environmental scanning electron microscope , optics , chemistry , nanotechnology , composite material , physics , meteorology , biochemistry , organic chemistry
SUMMARY Electron microscopy of frozen‐hydrated specimens is frequently impaired by atmospheric humidity, introduced together with the cold specimen and subsequently condensing on it. This effect can be prevented in the Philips 400 electron microscope operating with the cold stage PW6591 by an improved anticontaminator described in this note. The retractable anticontaminator is formed by two adjustable liquid‐nitrogen cooled blades placed just above and below the specimen. It does not interfere with any other feature of the microscope.