Premium
Correcting electron energy loss spectra for artefacts introduced by a serial data collection system
Author(s) -
Craven A. J.,
Buggy T. W.
Publication year - 1984
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1984.tb00531.x
Subject(s) - photomultiplier , optics , signal (programming language) , dynamic range , linearity , spectroscopy , energy (signal processing) , amplifier , spectrometer , physics , wide dynamic range , materials science , computer science , optoelectronics , detector , cmos , quantum mechanics , programming language
SUMMARY The large range of signal intensities found in electron energy loss spectroscopy causes difficulty when trying to record the spectrum accurately. This paper describes a system which records the data serially as simultaneous pulse and analogue signals without the need for changing the gain of the photomultiplier tube during the scan. The effect of deadtime and dark current on the recorded signals is discussed and procedures for correcting the data for these effects are described. At the same time, it is possible to correct the data for stray signal in the spectrometer and non‐linearity in the photomultiplier head‐amplifier at high output signal levels. In addition to its use for electron energy loss spectroscopy, this system is ideal for recording other signals which have a wide dynamic range and change rapidly from point to point, e.g. energy filtered diffraction patterns from thin amorphous films.