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On the use of ionization cross sections in analytical electron microscopy
Author(s) -
Williams D. B.,
Newbury D. E.,
Goldstein J. I.,
Fiori C. E.
Publication year - 1984
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1984.tb00529.x
Subject(s) - ionization , cross section (physics) , electron microscope , range (aeronautics) , electron , atomic physics , microanalysis , value (mathematics) , computational physics , section (typography) , materials science , analytical chemistry (journal) , chemistry , physics , optics , computer science , mathematics , nuclear physics , statistics , ion , quantum mechanics , chromatography , organic chemistry , composite material , operating system
SUMMARY There are two approaches to the utilization of the ionization cross section, Q , for use in the determination of k A B factors for quantitative microanalysis in the analytical electron microscope. The first approach is to interpolate a value of Q from experimentally determined k A B factors at a fixed accelerating voltage (kV). The second approach uses a theoretical parameterization of Q generated by fitting the fundamental Bethe expression to selected experimental values of Q over a wide range of kV. This paper discusses the relative merits of the two approaches.