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Understanding thin film X‐ray spectra
Author(s) -
Chapman J. N.,
Nicholson W. A. P.,
Crozier P. A.
Publication year - 1984
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1984.tb00527.x
Subject(s) - bremsstrahlung , photon , spectral line , microanalysis , simple (philosophy) , parametric statistics , x ray , physics , production (economics) , computational physics , atomic physics , optics , chemistry , mathematics , quantum mechanics , statistics , economics , macroeconomics , philosophy , organic chemistry , epistemology
SUMMARY Formulae suitable for predicting X‐ray production cross‐sections in thin foils are described. A modified Bethe‐Heitler equation seems well suited to describe the production of bremsstrahlung photons and, for fixed experimental conditions, may be expressed in a simple parametric form. Simple equations for calculating characteristic photon production are less satisfactory and the predictions of different formulae differ markedly. For microanalytical purposes, however, where relative rather than absolute cross‐sections are required, the differences become less pronounced. Finally, some uses for the cross‐sections in X‐ray microanalysis are considered.