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A parametric partial cross section for ELS
Author(s) -
Joy David C.
Publication year - 1984
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1984.tb00506.x
Subject(s) - parametric statistics , cross section (physics) , ionization , microanalysis , atomic physics , section (typography) , computational physics , sensitivity (control systems) , spectroscopy , physics , chemistry , computer science , electronic engineering , mathematics , engineering , quantum mechanics , statistics , ion , organic chemistry , operating system
SUMMARY A parametric expression has been developed which permits the rapid calculation of partial ionization cross sections, for most of the elements and experimental conditions encountered in electron energy loss spectroscopy, without the need for a computer. Since the results are in good agreement with those obtained using the full hydrogenic model, this approximation should be useful for such requirements as rapid microanalysis, or in calculations such as those of detection sensitivity where an analytical approximation to the cross section is needed.