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The application of scanning transmission electron microscopy (STEM) to the study of thin anodic films on nickel and nickel‐molybdenum alloys
Author(s) -
Moriya M.,
Ives M. B.
Publication year - 1984
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1984.tb00481.x
Subject(s) - nickel , molybdenum , materials science , scanning transmission electron microscopy , transmission electron microscopy , scanning electron microscope , anode , metallurgy , nanotechnology , chemistry , composite material , electrode
SUMMARY Anodized thin‐film samples of nickel, molybedenum and a nickel‐13 w/o molybdenum alloy have been analysed by scanning transmission electron microscopy, using selected area diffraction, microdiffraction and X‐ray micro‐analysis. Thin‐film samples were obtained by ion thinning with argon and by electropolishing in acetic acid‐perchloric acid. Electropolishing is the preferred technique for these studies, producing a surface with roughness on a scale of 1 nm. The anodized films on nickel and nickel 13 w/o molybdenum alloy exhibit a rugosity with a ‘particle’ size of 3 nm. The crystal structure of the films is similar to f.c.c. nickel oxide. Molybdenum enrichment was detected in the anodized alloy surfaces but there is no electron diffraction evidence for a crystalline molybdenum oxide. The electron diffraction pattern from anodized pure molybdenum suggests that the surface film is amorphous.