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Differential phase contrast in scanning optical microscopy
Author(s) -
Hamilton D. K.,
Sheppard C. J. R.
Publication year - 1984
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1984.tb00460.x
Subject(s) - differential interference contrast microscopy , optics , microscopy , contrast (vision) , optical microscope , microscope , phase contrast microscopy , resolution (logic) , materials science , phase (matter) , detector , reflection (computer programming) , differential (mechanical device) , physics , artificial intelligence , computer science , scanning electron microscope , quantum mechanics , programming language , thermodynamics
SUMMARY High‐quality high‐resolution transmission and reflection images produced using a scanning optical microscope and the split‐detector technique are presented. These images exhibit differential phase contrast, the method avoiding some drawbacks of the usual Nomarski DIC arrangement. Imaging is treated theoretically and compared with the Nomarski method.