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A statistical method for the analysis of quantitative thin‐film X‐ray microanalytical data
Author(s) -
Blake D. F.,
Isaacs A. M.,
Kushler R. H.
Publication year - 1983
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1983.tb04251.x
Subject(s) - statistical analysis , materials science , analytical chemistry (journal) , computer science , chemistry , statistics , chromatography , mathematics
SUMMARY A series of equations is presented through which thin‐film X‐ray microanalytical data may be characterized statistically. Test statistics based on the Gaussian distribution are then presented, together with examples of the use and evaluation of an empirically derived Mg/Ca working curve.