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Combining accurate defocus with low‐dose imaging in high resolution electron microscopy of biological material
Author(s) -
Wrigley N. G.,
Brown Elaine,
Chillingworth R. K.
Publication year - 1983
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1983.tb04220.x
Subject(s) - biological specimen , optics , electron microscope , transmission electron microscopy , resolution (logic) , materials science , microscopy , electron , dark field microscopy , cathode ray , electron tomography , scanning transmission electron microscopy , computer science , physics , artificial intelligence , quantum mechanics
SUMMARY High resolution (< 2 nm) electron microscopy of biological specimens requires three exacting conditions to be met simultaneously: (a) fine specimen detail must be protected from destruction by the electron beam (low dose), (b) the electron optics must be adjusted to be capable of imaging that detail interpretably (accurate defocus), and (c) a suitable field of interest must be identified. We describe a method encompassing all three with an 80% success rate using only minor modifications to a transmission electron microscope, and no expensive on‐line computing.