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Electron trajectory‐linked phenomena in thin foil X‐ray microanalysis
Author(s) -
Jones I. P.,
Nicholls A. W.
Publication year - 1983
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1983.tb04214.x
Subject(s) - scattering , microanalysis , electron , electron scattering , trajectory , physics , gaussian , forward scatter , computational physics , optics , electron probe microanalysis , atomic physics , chemistry , nuclear physics , quantum mechanics , scanning electron microscope , organic chemistry
SUMMARY The methods of calculating electron trajectories are reviewed. Approximate methods may be necessary because of computing time problems on small computers. The various situations in microanalysis where electron trajectories are important are discussed in turn. It appears that the single scattering theory of Goldstein et al . (1977) is useful for situations dominated by high scattering angle events whereas the Gaussian theory of Doig et al . (1981a) may be appropriate to multiple low angle scattering. This type of calculation might turn out to be unnecessary if coincident counting techniques are exploited.