Premium
Recent improvements to the Cambridge University 600 kV High Resolution Electron Microscope
Author(s) -
Smith David J.,
Camps R. A.,
Freeman L. A.,
Hill R.,
Nixon W. C.,
Smith K. C. A.
Publication year - 1983
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1983.tb04211.x
Subject(s) - tilt (camera) , optics , cathode ray , electron , electron microscope , beam (structure) , resolution (logic) , physics , materials science , atomic physics , nuclear physics , computer science , mathematics , geometry , artificial intelligence
SUMMARY Several recent modifications to the Cambridge University 600 kV HREM have resulted in increased levels of performance and greater operating efficiency. Changes include new Permendur pole‐pieces with a reduced gap leading to improved aberration coefficients, and an attachment to the tilt/shift supplies which facilitates accurate beam alignment. Resolution figures include: (a) an axial CTF extending, without zeros, beyond 1·8 Å at 575 kV; (b) tilted beam CTFs extending beyond 1·1 Å; and (c) lattice fringes of 0·72 Å spacing.