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THE ROLE OF FAST SECONDARY ELECTRONS IN DEGRADING SPATIAL RESOLUTION IN THE ANALYTICAL ELECTRON MICROSCOPE
Author(s) -
Joy D. C.,
Newbury D. E.,
Myklebust R. L.
Publication year - 1982
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1982.tb00442.x
Subject(s) - citation , library science , electron , physics , computer science , resolution (logic) , artificial intelligence , nuclear physics