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On‐line image processing in high resolution electron microscopy
Author(s) -
Boyes E. D.,
Muggridge B. J.,
Goringe M. J.
Publication year - 1982
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1982.tb00429.x
Subject(s) - optics , line (geometry) , image processing , pixel , computer science , digital image processing , resolution (logic) , computer vision , computer graphics (images) , electron microscope , microscopy , artificial intelligence , materials science , microscope , software , fast fourier transform , physics , image (mathematics) , algorithm , mathematics , geometry , programming language
SUMMARY On‐line processing and analysis of high resolution electron microscope (HREM) images has been implemented using a software controlled image processor based on a commercial digital video framestore. It directly digitizes the output from the low light TV camera on the HREM and applies any processing necessary. The conditions under which images from amorphous specimens are being obtained can be established on‐line. The fast fourier transforms (FFTs) of 256 times 256 pixels produced in 15 s with the system off‐line are comparable to those from diffraction analysis of the same data on a laser optical bench. The precision of analysis of defocus, aberrations and astigmatism on‐line is discussed, together with possible approaches to routine analysis of crystalline specimens and for interactive control.