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Study of supported ruthenium catalysts by STEM
Author(s) -
Pennycook S. J.
Publication year - 1981
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1981.tb01301.x
Subject(s) - ruthenium , microanalysis , diffraction , detector , materials science , catalysis , hexagonal crystal system , spectral line , metal , scanning transmission electron microscopy , crystallography , transmission electron microscopy , optics , nanotechnology , chemistry , physics , metallurgy , organic chemistry , astronomy
SUMMARY A VG Microscopes' HB5 STEM has been used to study supported ruthenium catalysts provided by ICI Ltd. They consist of small ruthenium particles 3–10 nm in diameter and have been imaged using a variety of detectors. The signal combining strongest contrast from the particles with minimum contrast variations due to diffraction effects is from a high angle annular detector. The detector is particularly useful with crystalline supports. For microanalysis purposes, X‐ray spectra, electron energy loss spectra, and microdiffraction patterns have been recorded and together show conclusively that even the smallest particles are hexagonal ruthenium metal.