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Checking of linearity of the photoelectric system of a microscope photometer
Author(s) -
Piller Horst
Publication year - 1981
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1981.tb01215.x
Subject(s) - linearity , photometer , photoelectric effect , transmittance , optics , electronic circuit , materials science , signal (programming language) , computer science , optoelectronics , physics , electronic engineering , electrical engineering , engineering , programming language
SUMMARY For accurate photometric measurements linearity between the measured property of the object, e.g. transmittance, reflectance, fluorescence intensity, and the measuring signal plays an important role. Although modern photoelectric equipment is designed to provide practically perfect linearity there may be factors by which linearity is disturbed, e.g. ageing, heating, improper operation of equipment, defects in electric circuits, etc. The three‐polar method described in this paper involves the most convenient and objective testing of linearity by the operator.