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Discriminatory X‐ray mapping of two or more elements by a pulse stretch method
Author(s) -
Johns I. A.,
Skyring G. W.
Publication year - 1980
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1980.tb04138.x
Subject(s) - analyser , spinel , ilmenite , pulse (music) , materials science , optics , energy (signal processing) , mineralogy , physics , metallurgy , geology , quantum mechanics , detector
SUMMARY A pulse‐stretch analyser attached to an Energy Dispersive Spectrophotometer for the simultaneous mapping of two or more elements is described. The circuit for the instrument is given and examples of variable spot‐size maps which may be generated, are shown by the distribution of Si, Ti and Cr in polished grains of ilmenite, garnet, spinel and clinopyroxine.