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High resolution electron microscopy of some carbonaceous materials
Author(s) -
Iijima Sumio
Publication year - 1980
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1980.tb04081.x
Subject(s) - microcrystalline , amorphous solid , materials science , amorphous carbon , thin film , graphite , carbon film , carbon fibers , crystal (programming language) , evaporation , perpendicular , resolution (logic) , electron microscope , optics , nanotechnology , crystallography , composite material , chemistry , physics , composite number , computer science , geometry , mathematics , artificial intelligence , programming language , thermodynamics
SUMMARY The image contrast of extremely thin films of amorphous carbonaceous materials has been studied experimentally using thin supporting films of single crystal graphite. The use of thin specimens reduces the ‘overlap’ effect in imaging amorphous materials. Image contrast of their images was therefore interpreted by the ‘projected potential approximation’. Single sheets of graphitic carbon crystal were imaged with c perpendicular to the beam and their image details were compared with those of the amorphous carbon films. This comparison demonstrated that amorphous carbon films prepared by evaporation contained microcrystalline regions having graphitic structure.