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Observations on the structure of amorphous arsenic by high resolution electron microscopy
Author(s) -
Stobbs W. M.,
Smith David J.
Publication year - 1980
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1980.tb04073.x
Subject(s) - microcrystalline , amorphous solid , arsenic , materials science , amorphous carbon , dark field microscopy , scattering , resolution (logic) , optics , crystallography , microscopy , chemistry , physics , metallurgy , artificial intelligence , computer science
SUMMARY Results are presented of a preliminary investigation of the structure of sputtered films of amorphous arsenic, using both high resolution bright field and tilted illumination dark field imaging modes. It is demonstrated that the material is not microcrystalline but appears to show a different form of short range order than is seen in films of amorphous carbon or germanium. The low angle scattering for the thin films was found to be very variable and it is suggested that this is associated with variability of a ‘cavern‐like’ structure and of the normal triple coordination.