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Measurement of radiation damage by electron energy‐loss spectroscopy
Author(s) -
Egerton R. F.
Publication year - 1980
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1980.tb00288.x
Subject(s) - electron energy loss spectroscopy , irradiation , ionization , electron , spectroscopy , materials science , atomic physics , radiation , radiation damage , electron beam processing , analytical chemistry (journal) , copper , radiochemistry , chemistry , ion , transmission electron microscopy , physics , optics , nanotechnology , nuclear physics , organic chemistry , chromatography , quantum mechanics , metallurgy
SUMMARY Inner shell ionization edges in the energy‐loss spectrum were used to measure the loss of gaseous elements from thin samples of nitrocellulose, polyvinyl formal, copper phthalocyanine, graphite bisulphate and sodium chloride during exposure to 80 keV electrons. The irradiation kinetics were measured for electron doses up to 10 4 C m −2 and for dose rates up to 10 mA m −2 . The energy‐loss technique is discussed in relation to other methods for assessing radiation damage.