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A simple, combined diffractometer and scanning microdensitometer
Author(s) -
Longley W.
Publication year - 1980
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1980.tb00268.x
Subject(s) - microdensitometer , micrograph , diffractometer , scanning electron microscope , materials science , optics , diffraction , simple (philosophy) , electron micrographs , electron microscope , physics , philosophy , epistemology
SUMMARY A simple device for densitometering electron micrographs or other transparencies by one‐dimensional scanning is described. Micrographs of crystalline materials are oriented by means of their optical diffraction patterns displayed with a slightly modified microscope.