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Use of fast X‐ray film for low‐fluence biological electron microscopy at 100 kV and 1000 kV
Author(s) -
Parsons Donald F.,
Marko Michael,
King Murray Ver
Publication year - 1980
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1980.tb00255.x
Subject(s) - fluence , electron microscope , materials science , scanning electron microscope , acceleration voltage , cathode ray , microscopy , electron , electron beam processing , resolution (logic) , optics , yield (engineering) , irradiation , optoelectronics , physics , computer science , composite material , nuclear physics , artificial intelligence
SUMMARY A user evaluation has been made by electron microscopists of an X‐ray film for routine electron microscopy. The recent improvements in mammographic X‐ray films, with the attempt to reduce the patient dose required to produce a high‐resolution mammogram, have resulted in some useful films for medium‐ and high‐voltage electron microscopy. They can yield essential cytological information with a reduction of the electron fluence (exposure) applied to the specimen of more than an order of magnitude compared with conventional electron‐microscope films. Their use is indicated in situations where beam damage is severe.