Premium
Determination of defocus values using ‘Fourier images’ for high resolution electron microscopy
Author(s) -
Iijima Sumio,
O'Keefe M. A.
Publication year - 1979
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1979.tb04691.x
Subject(s) - resolution (logic) , optics , electron microscope , fourier transform , transmission electron microscopy , microscope , materials science , high resolution , microscopy , high resolution transmission electron microscopy , physics , computer science , artificial intelligence , remote sensing , geology , quantum mechanics
SUMMARY The phenomenon of Fourier images is used to calibrate defocus steps of a high resolution transmission electron microscope. Results compare well with measurements from an optical diffractogram.