Premium
Resolution Of M 23 C 6 /Austenite Phase Boundary Defect Structures By Weak Beam Microscopy
Author(s) -
Nilsson J.O.,
Dunlop G. L.
Publication year - 1979
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1979.tb00175.x
Subject(s) - materials science , dark field microscopy , burgers vector , austenite , beam (structure) , optics , phase (matter) , partial dislocations , microscopy , resolution (logic) , enhanced data rates for gsm evolution , dislocation , optical microscope , crystallography , condensed matter physics , physics , microstructure , chemistry , metallurgy , scanning electron microscope , artificial intelligence , quantum mechanics , computer science , composite material , telecommunications
SUMMARY The weak beam dark field imaging technique has been successfully applied to the problem of imaging misfit dislocations at the interface between M 23 C 6 precipitates and an austenite matrix. The technique eliminates Moiré fringe contrast which otherwise obliterates the contrast from interfacial dislocations. Three sets of parallel dislocations were observed with spacings and line vectors consistent with them being edge dislocations with Burgers vectors of a /3<111>.