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A Simple Method For The Determination of Thickness and Grain Size of Deposited Films as Used On Non‐Conductive Specimens For Scanning Electron Microscopy
Author(s) -
Røli Jakob,
Flood Per R.
Publication year - 1978
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1978.tb00087.x
Subject(s) - spheres , materials science , transmission electron microscopy , scanning electron microscope , aggregate (composite) , transverse plane , composite material , coating , electron microscope , grain size , microscope , optics , nanotechnology , physics , structural engineering , astronomy , engineering
SUMMARY Latex spheres in linear aggregates allow coating materials to accumulate only along their free surface. Transverse to the axis of the aggregate the diameter of a sphere will increase corresponding to the uncoated diameter plus twice the film thickness. Parallel to the axis of the aggregate the diameter of terminal spheres will increase with one film thickness, whereas the diameter of ‘enclosed’ spheres remain constant. By mounting uniform latex spheres on standard electron microscope‐grids and comparing the transverse to the parallel diameter of linearly aggregated spheres in the transmission electron microscope, the film thickness produced by various coating procedures has been determined. The grain size and crack formations in the films may be examined simultaneously.