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A Method For Photographic Densitometry of Scanning Electron Micrographs
Author(s) -
HatamiMonazah Houshang,
Boss Jeffrey
Publication year - 1978
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1978.tb00084.x
Subject(s) - micrograph , electron micrographs , densitometry , scanning electron microscope , optics , materials science , chemistry , electron microscope , physics
SUMMARY A method is described for the study of the surface structure of mammalian chromosomes. Densitometric analysis of scanning electron micrographs permits the detection of regularities where overlying material obscures these in directly inspected micrographs. The method has been applied to the study of mammalian chromosomes.