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A combined top and side entry specimen stage for a Hitachi H500 transmission electron microscope
Author(s) -
Chapman S. K.
Publication year - 1977
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1977.tb01132.x
Subject(s) - magnification , transmission electron microscopy , materials science , electron microscope , tilt (camera) , resolution (logic) , microscope , optics , high resolution , nanotechnology , physics , computer science , geology , mathematics , geometry , artificial intelligence , remote sensing
SUMMARY The Hitachi H500 transmission electron microscope has been modified in order that both the top and side entry specimen stages may be fitted simultaneously. This made possible top entry multi‐specimen operation up to a maximum magnification of × 100,000 and a resolution of 1.8 nm, combined with the normal side entry stage facilities of ±60° tilt, 0.45 nm resolution and × 400,000 magnification.