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The restoration of damaged Philips electron microscope specimen holders used in the high‐resolution stage
Author(s) -
Maxwell M. H.,
McFarlane J. B.
Publication year - 1977
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1977.tb00039.x
Subject(s) - trouble shooting , electron microscope , microscope , materials science , high resolution , distortion (music) , optics , optoelectronics , physics , engineering , geology , amplifier , remote sensing , cmos , reliability engineering
SUMMARY This note describes how damaged Philips electron microscope specimen holders may be repaired simply and cheaply. The damaged part is replaced by a length of 18‐gauge syringe needle which is silver‐soldered into position. This simple and rapid repair caused no subsequent electrical distortion.