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Characterization of particulate material in very pure waters
Author(s) -
Biddle P.,
Miles J. H.
Publication year - 1976
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1976.tb02427.x
Subject(s) - particulates , scanning electron microscope , conventional transmission electron microscope , characterization (materials science) , environmental scanning electron microscope , electron microscope , transmission electron microscopy , materials science , analytical chemistry (journal) , particle (ecology) , microscope , diffraction , electron beam induced deposition , optics , nanotechnology , chemistry , environmental chemistry , scanning transmission electron microscopy , composite material , physics , oceanography , organic chemistry , geology
SUMMARY Techniques are described which enable exceptionally pure waters to be handled without contamination. The solids content which may be less than 1 part/10 8 , can be obtained on the electron microscope grid and transmission electron micrographs and diffraction patterns obtained. X‐ray spectra obtained using a Li drifted Si detector attached to a scanning electron microscope (SEM), are enhanced by use of an auxiliary circuit, which causes the electron beam to dwell on the particle surface much longer than over blank film. The problems involved in converting X‐ray count rates into an analysis are discussed. The analyses gave valuable information on the origin of the particulate material. Paper presented to the symposium on the ‘Use of the microscope in studies on air and water pollution’. Royal Microscopical Society, University of York, 17 December 1974.