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Electron microscope image contrast with double beam illumination from crystal supports
Author(s) -
Hines R. L.
Publication year - 1976
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1976.tb02420.x
Subject(s) - optics , crystal (programming language) , monocrystalline silicon , materials science , cluster (spacecraft) , contrast (vision) , beam (structure) , beam splitter , silicon , physics , optoelectronics , laser , computer science , programming language
SUMMARY When a cluster of atoms on the bottom side of a crystal is viewed in the vicinity of a bend contour, a double image of the cluster is formed. The crystal acts as a beam splitter so that an object on the bottom of the crystal is illuminated by two coherent but non‐parallel electron waves. The possibility of using double beam illumination to enhance the contrast of amorphous phase objects is discussed. Experimental results are presented for the image contrast of clusters formed by evaporating gold and aluminium on to the bottom side of graphite and silicon crystals.