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A simple method to measure resolution on micrographs
Author(s) -
Dubochet Jacques
Publication year - 1976
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1976.tb02413.x
Subject(s) - micrograph , measure (data warehouse) , resolution (logic) , moiré pattern , simple (philosophy) , visualization , electron micrographs , computer science , microscope , artificial intelligence , computer vision , optics , physics , electron microscope , data mining , scanning electron microscope , philosophy , epistemology
SUMMARY A method for rapid measurement of the resolution of a microscope by finding the smallest distance between pairs of points that appear on two successive micrographs is described. The method based on the visualization of moiré pattern gives the same result as other tests with a precision sufficient for routine checks. Neither a special instrument nor time consuming training are required.