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Image processing of electron micrographs of deformed filaments
Author(s) -
Fraser R. D. B.,
MacRae T. P.,
Suzuki E.,
Davey C. L.
Publication year - 1976
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1976.tb01108.x
Subject(s) - electron micrographs , micrograph , protein filament , image processing , electron microscope , projection (relational algebra) , fourier transform , optics , materials science , scanning electron microscope , physics , image (mathematics) , computer vision , computer science , composite material , algorithm , quantum mechanics
SUMMARY Electron micrographs of filaments are frequently unsuitable for image processing because they are not perfectly straight. Even minor departures from straightness result in appreciable deterioration of the Fourier transform and analysis of periodicities and subsequent image processing becomes difficult. A procedure is described for recovering the projection of a straight filament from that of an imperfectly straight filament.