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The nature of defocus fringes in scanning‐transmission electron microscope images
Author(s) -
Joy David C.,
Maher Dennis M.,
Cullis Anthony G.
Publication year - 1976
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1976.tb01089.x
Subject(s) - optics , contrast (vision) , refraction , electron , fresnel diffraction , physics , diffraction , scanning transmission electron microscopy , displacement (psychology) , electron microscope , materials science , enhanced data rates for gsm evolution , computer science , psychology , telecommunications , quantum mechanics , psychotherapist
SUMMARY Experimental observations have been made of the fringe contrast which appears at the terminating edges of thin objects in defocused, scanning‐transmission electron micrographs. In general only a single bright fringe is present and the displacement and width of this fringe was found to vary linearly with defocus, indicating the contrast does not result from simple‐Fresnel diffraction. A model for this contrast, based on the refraction of incident electrons by the object edge, is shown to explain the observed results.