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Topographic intensity profiles in the scanning electron microscope—cubes
Author(s) -
George E. P.,
Robinson V. N. E.
Publication year - 1975
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1975.tb04062.x
Subject(s) - cube (algebra) , intensity (physics) , monte carlo method , scanning electron microscope , plane (geometry) , substrate (aquarium) , optics , square (algebra) , materials science , electron , range (aeronautics) , computation , molecular physics , physics , geometry , mathematics , geology , statistics , oceanography , algorithm , quantum mechanics , composite material
SUMMARY Two‐dimensional Monte Carlo computations have been used to predict the backscattered and secondary electron intensity profiles when a plane surface has a square of side d standing out from it. This was taken as a model for a gold cube of dimensions d situated on a thick gold substrate. This latter situation has been approximately reproduced experimentally and the predicted intensity profiles show quite good agreement with the observed intensity profiles for a range of values of the dimension d .