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A simple technique for examining frozen hydrated specimens in the scanning electron microscope
Author(s) -
Robinson V. N. E.
Publication year - 1975
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1975.tb04027.x
Subject(s) - scanning electron microscope , materials science , electron microscope , stub (electronics) , optics , detector , conventional transmission electron microscope , microscope , environmental scanning electron microscope , distortion (music) , scanning transmission electron microscopy , optoelectronics , composite material , physics , amplifier , structural engineering , cmos , engineering
SUMMARY The use of a wide angle backscattered electron detector in a scanning electron microscope, which has the capability of the specimen chamber pressure being controlled independently of the column pressure, provides a simple technique for examining frozen hydrated specimens. Large specimens have been examined within 1 min of being placed on the stub and have been examined for many hours without charging artefacts or distortion due to dehydration.