Premium
The ‘through focus plate’: a simple method for obtaining images through focus on a single photographic plate in the electron microscope using a tilting stage
Author(s) -
Rowlatt C.
Publication year - 1975
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1975.tb04013.x
Subject(s) - optics , microscope , electron microscope , lens (geology) , focus (optics) , displacement (psychology) , zone plate , focal point , enhanced data rates for gsm evolution , materials science , depth of field , microscopy , physics , cardinal point , computer science , artificial intelligence , diffraction , psychology , psychotherapist
SUMMARY Tilting the specimen in an electron microscope by a relatively small angle can provide a continuous through focal series on a single plate, as the displacement of the object at the edge of the field can be adjusted to be of the same order of magnitude as the alteration of focal point by the fine lens controls. This simple rapid manoeuvre could have applications in the microscopy of uniform preparations, particularly if the specimen is subject to beam damage, and in assessing microscope performance rapidly.