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A direct recording corrected microspectrofluorometer
Author(s) -
Mayer R. T.,
Novacek V. M.
Publication year - 1974
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1974.tb03976.x
Subject(s) - generator (circuit theory) , sensitivity (control systems) , range (aeronautics) , sample (material) , wavelength , optics , spectral line , excitation , computer science , physics , materials science , electronic engineering , power (physics) , quantum mechanics , astronomy , engineering , composite material , thermodynamics
Summary The construction of a microspectrofluorometer with automatic correction capabilities is given. The instrument uses a quantum counting system for correction of excitation spectra and an interpolating function generator for correction of emission spectra. An inexpensive analogue computer is an integral part of the electronic portion of the instrument and allows a number of mathematical manipulations to be performed on the sample and reference signals prior to recording or display. Under the conditions stated, the sensitivity of the instrument is in the 10 −9 M range for quinine sulphate irradiated at 365 nm. The linear response range for quinine sulphate is 10 −3 to 10 −9 M. The operational wavelength range of the machine is between 226 and 700 nm.