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Scanning transmission electron microscopy *
Author(s) -
Crewe Albert V.
Publication year - 1974
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1974.tb03937.x
Subject(s) - conventional transmission electron microscope , scanning transmission electron microscopy , resolution (logic) , microscope , transmission electron microscopy , electron microscope , scanning electron microscope , optics , low voltage electron microscope , high resolution transmission electron microscopy , scanning confocal electron microscopy , materials science , nanotechnology , physics , computer science , artificial intelligence
SUMMARY The scanning transmission electron microscope is of quite recent origin, and it is only in the last few years that it has been shown that this instrument is capable of giving the same high resolution as the conventional electron microscope. In this article we examine the conditions necessary for the achievement of high resolution and also the various modes of contrast which can be obtained from this instrument. Finally, we suggest other ways in which the microscope can be used in future investigations.