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Trends and prospects in scanning electron microscopy
Author(s) -
Hayes Thomas L.
Publication year - 1974
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1974.tb03923.x
Subject(s) - scanning electron microscope , instrumentation (computer programming) , scanning confocal electron microscopy , resolution (logic) , materials science , microscopy , electron microscope , nanotechnology , optics , computer science , physics , artificial intelligence , operating system
SUMMARY Scanning electron microscopy is developing towards increased analytic capabilities such as characteristic X‐ray analysis as a routine adjunct to the topographic image. At the same time improved instrumentation will make higher resolution possible for both ultra‐thin and bulk specimens. Some of the newer techniques for specimen preparation are also noted.