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A method for accurately determining lattice parameters using electron diffraction in a commercial electron microscope
Author(s) -
Lodder J. C.,
Berg K. G. v.d.
Publication year - 1974
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1974.tb03916.x
Subject(s) - lattice constant , diffraction , electron , lattice (music) , electron diffraction , crystallite , electron microscope , computational physics , materials science , optics , systematic error , physics , condensed matter physics , mathematics , statistics , quantum mechanics , acoustics , metallurgy
Summary In this paper an electron diffraction method is discussed by which the lattice constants of polycrystalline thin films can be accurately determined (0.1%). The method involves the sequential examination of a standard material and the unknown material mounted on separate grids. The error which can arise through the possible difference in height of the two grids can be corrected by means of height and tilting adjustments. The analytical approach of the dependence of the camera constant on the ring diameter as given in literature appears to be insufficient. An experimental correction factor for this dependence is introduced. The accuracy of this method, and the influence of relevant sources of error, are discussed and explained in terms of some experimental results.