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Performance characteristics of a microreflectometer for measuring autoradiographic grain density
Author(s) -
Entingh Dan
Publication year - 1974
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1974.tb03864.x
Subject(s) - photometer , microscope , optics , materials science , grain size , mineralogy , chemistry , physics , composite material
SUMMARY An incident light microphotometer for measuring reflectance has been constructed from Wild M20 microscope components and Photovolt 520‐M photometer. The instrument measures autoradiographic silver grain densities in either small regions (5–30 μm diameter) or large regions (25–150 μm diameter) with an accuracy of greater than 90% compared to visual grain counts. Grain density measurements can be made in the presence of histological stains. The device speeds the collection of autoradiographic data by a factor of 10 or more, and can be used for 6 or 7 h per day without producing significant strain on the operator.