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Field‐ion microscopy of interphase interfaces
Author(s) -
Hildon A.,
Howell P. R.,
Youle A.,
Taunt R. J.,
Page T. F.,
Ralph B.
Publication year - 1973
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1973.tb03851.x
Subject(s) - interphase , consistency (knowledge bases) , field (mathematics) , variety (cybernetics) , orientation (vector space) , microscopy , field ion microscope , materials science , biological system , computer science , statistical physics , chemical physics , ion , chemistry , physics , optics , mathematics , geometry , artificial intelligence , biology , genetics , organic chemistry , pure mathematics
SUMMARY This paper demonstrates the use of the analytical techniques, developed in the companion paper, to determine interfacial parameters from a variety of multiphase structures. It is shown that accurate orientation relationships and the structure of unknown phases can be derived from this approach. In some cases assumptions have to be made concerning some of the interfacial parameters, but these assumptions can always be checked from the self‐consistency of the full analysis.