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Field‐ion microscopy of interphase interfaces
Author(s) -
Hildon A.,
Howell P. R.,
Page T. F.,
Ralph B.
Publication year - 1973
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1973.tb03850.x
Subject(s) - interphase , field ion microscope , field (mathematics) , plane (geometry) , matching (statistics) , ion , interface (matter) , materials science , microscopy , image contrast , optics , chemistry , physics , composite material , geometry , mathematics , biology , genetics , statistics , organic chemistry , capillary number , capillary action , pure mathematics
SUMMARY This paper considers the relationship between the bulk matching of plane stacks abutting an interphase interface and the resultant matching of plane rings seen in the field‐ion image. An image contrast model is developed whereby the interfacial parameters may be deduced from field‐ion investigations and the methods of data acquisition and handling are considered.