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Recent developments in analytical electron microscopy
Author(s) -
Chandler John A.
Publication year - 1973
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1973.tb03840.x
Subject(s) - transmission electron microscopy , resolution (logic) , electron microscope , biological specimen , work (physics) , materials science , elemental analysis , nanotechnology , electron , scanning transmission electron microscopy , microscopy , scanning electron microscope , computer science , optics , chemistry , physics , artificial intelligence , composite material , organic chemistry , quantum mechanics , thermodynamics
SUMMARY Recent years have seen the way in which the analytical electron microscope has been applied to problems involving thin specimens in metallurgy, mineralogy and many branches of biology. The limits of sensitivity have been explored and its potential usefulness in these fields investigated. Problems concerning the interaction of electrons with the specimen are discussed in relation to the correct choice of operating conditions and specimen preparation. In biological work, frozen sections provide new information about subcellular elemental localization of mobile electrolytes, while analysis of tissue prepared by conventional means is used to detect physiological levels of some naturally occurring elements. Examination of mineral dispersions provides analysis of particles just 10 nm thick, visible only in transmission electron microscopy, and further work with thin metal foils confirms the value of high resolution transmission imaging as a complementary facility to micro‐analysis. Work has been done to investigate the possibilities of improving sensitivities both by changing operational parameters and instrumental design, and the value of quantitation in thin specimen analysis explored.