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Instrumental aspects of image analysis in the electron microscope
Author(s) -
Mulvey T.
Publication year - 1973
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1973.tb03831.x
Subject(s) - diffractometer , electron micrographs , electron microscope , projection (relational algebra) , optics , micrograph , biological specimen , electron , computer science , physics , scanning electron microscope , algorithm , nuclear physics
SUMMARY Methods of analysing electron micrographs are reviewed, with special reference to the needs of the practising electron microscopist. It is concluded that a simplified optical diffractometer and a projection ‘Periodograph’ can be particularly helpful, especially in biological investigations, to which extensive reference is made in the bibliography.