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The principles and practice of the weak‐beam method of electron microscopy
Author(s) -
Cockayne D. J. H.
Publication year - 1973
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1973.tb03815.x
Subject(s) - electron microscope , cathode ray , optics , materials science , resolution (logic) , diffraction , microscopy , electron diffraction , electron , computer science , nanotechnology , physics , artificial intelligence , nuclear physics
SUMMARY The weak‐beam method of electron microscopy enables the high resolution capabilities of the electron microscope to be used in the study of lattice defects. In this paper, the principles of the method are outlined and the experimental procedures for obtaining weak‐beam images are discussed. The experimental diffraction conditions necessary for obtaining quantitative results and the limitations of the method are summarized, and applications of the method to various problems in defect studies are reviewed.