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Electron microscope measurements: A digital read‐out across the intermediate lens
Author(s) -
Yodaiken Ralph E.
Publication year - 1972
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1972.tb03746.x
Subject(s) - magnification , reproducibility , microscope , lens (geology) , optics , projector , electron microscope , voltmeter , computer science , materials science , physics , chemistry , power (physics) , chromatography , quantum mechanics
SUMMARY In order to ensure reproducibility of magnification and to determine the accuracy of figures taken from the magnification meter on the side of a Siemens electron microscope, a sensitive voltmeter with a digital read‐out was put in the intermediate as well as the objective and projector lens circuits. The microscope was calibrated on different days and the results of the magnification measurements taken from the scale were compared with the results obtained using the read‐out system. The conclusions underline the necessity for exercising caution in interpreting magnification figures and suggest a relatively inexpensive method of improving reproducibility.