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The photo‐emission electron microscope: Its technique and applications
Author(s) -
Wlegmann L.
Publication year - 1972
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1972.tb03739.x
Subject(s) - resolution (logic) , optics , electron microscope , scanning electron microscope , microscope , materials science , electron , image resolution , physics , computer science , artificial intelligence , quantum mechanics
SUMMARY This article gives a survey of the actual experience with the relatively new technique of photo‐emission electron microscopy. After describing the principal technique and the features of a modern high resolution instrument, the questions of image generation, contrast formation and resolution are considered. In particular the influence of the depth of information on resolution for flat polished sections is studied and some comparisons with the scanning electron microscope (SEM) are made.* The different fields of application of the photo‐EEM are shown by examples.