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Analysis of dendrite patterns by use of an adaptive scan system *
Author(s) -
Wyss Urs R.
Publication year - 1972
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1111/j.1365-2818.1972.tb03726.x
Subject(s) - interfacing , raster scan , modular design , chord (peer to peer) , raster graphics , computer science , focus (optics) , dendrite (mathematics) , oscilloscope , computer vision , artificial intelligence , computer graphics (images) , computer hardware , optics , mathematics , physics , geometry , telecommunications , distributed computing , detector , operating system
SUMMARY A scanning procedure is described by which means morphometric parameters of dendrite tree structures may be collected with low operator interaction. The system requires a small computer with 4K core and interfacing to A/D and D/A converters, a scanning oscilloscope, a standard microscope and a photo‐multiplier tube. Modular, or local pattern information is sampled on a circular scan raster, and standardized patterns specified in terms of the number of dendrite processes scanned. These modular patterns are linked together to map a chord approximation of the object. Branches out of focus are recognized and the stage adjusted by remote control of a stepping motor. The paper records a pilot study, performed at the Department of Anatomy, University of Rochester, N. Y.